Scanning electron microscopy - HITACHI TM4000 Plus II
Description
- The Scanning Electron Microscope (SEM) facilitates high-precision observations and analyses, since it offers a magnification of up to 3,000 times. It is equipped with an electron source using a tungsten filament and can operate at voltages of 5, 10 or 15 kV, with BSE, SE or Mix (BSE+SE) modes. The maximum dimensions of the samples that can be observed are 80 mm in diameter and 50 mm in height.